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Effect of annealing time on the structural, optical and electrical characteristics of DC sputtered ITO thin films

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dc.contributor.authorSenol, SD
dc.contributor.authorSenol, A
dc.contributor.authorOzturk, O
dc.contributor.authorErdem, M
dc.date.accessioned2023-04-15T22:38:35Z
dc.date.available2023-04-15T22:38:35Z
dc.date.issued2014.01.01
dc.identifier.doi10.1007/s10854-014-2262-y
dc.identifier.eissn1573-482X
dc.identifier.endpage4999
dc.identifier.issn0957-4522
dc.identifier.issue11
dc.identifier.startpage4992
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000344808800041&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/9270
dc.identifier.volume25
dc.identifier.wosWOS:000344808800041
dc.relation.ispartofJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
dc.titleEffect of annealing time on the structural, optical and electrical characteristics of DC sputtered ITO thin films
dc.typeArticle
dspace.entity.typeWos
relation.isPublicationOfWos086e37ab-4764-42f9-ade8-5e0a84314e2c
relation.isPublicationOfWos.latestForDiscovery086e37ab-4764-42f9-ade8-5e0a84314e2c

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