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Effect of annealing time on the structural, optical and electrical characteristics of DC sputtered ITO thin films

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2014.01.01

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https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000344808800041&DestLinkType=FullRecord&DestApp=WOS
 https://hdl.handle.net/20.500.12597/9270

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