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Comparative investigation on electronic properties of metal-semiconductor structures with variable ZnO thin film thickness for sensor applications

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dc.contributor.authorCicek, O
dc.contributor.authorKurnaz, S
dc.contributor.authorBekar, A
dc.contributor.authorOzturk, O
dc.date.accessioned2023-04-18T02:55:29Z
dc.date.available2023-04-18T02:55:29Z
dc.date.issued2019.01.01
dc.identifier.doi10.1016/j.compositesb.2019.106987
dc.identifier.eissn1879-1069
dc.identifier.endpage
dc.identifier.issn1359-8368
dc.identifier.issue
dc.identifier.startpage
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000485853800019&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/10245
dc.identifier.volume174
dc.identifier.wosWOS:000485853800019
dc.relation.ispartofCOMPOSITES PART B-ENGINEERING
dc.titleComparative investigation on electronic properties of metal-semiconductor structures with variable ZnO thin film thickness for sensor applications
dc.typeArticle
dspace.entity.typeWos
relation.isPublicationOfWos73bacfc9-4bac-4ca7-9450-40dd5fc193bc
relation.isPublicationOfWos.latestForDiscovery73bacfc9-4bac-4ca7-9450-40dd5fc193bc

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