Web of Science:
Comparative investigation on electronic properties of metal-semiconductor structures with variable ZnO thin film thickness for sensor applications

Placeholder

Organizational Units

Program

KU Authors

KU-Authors

Co-Authors

Authors

Advisor

Date

2019.01.01

Language

Type

Article

Journal Title

Journal ISSN

Volume Title

Abstract

Description

Source:

Publisher:

Keywords:

Keywords

Citation

URI

https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000485853800019&DestLinkType=FullRecord&DestApp=WOS
 https://hdl.handle.net/20.500.12597/10245

Collections

WoS İndeksli Yayınlar

Endorsement

Review

Supplemented By

Referenced By

0

Views

0

Downloads

View PlumX Details


Sustainable Development Goals