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Comparison of theoretical and experimental microhardness of tetrahedral binary Zn1-xErxO semiconductor polycrystalline nanoparticles

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dc.contributor.authorAsikuzun, E
dc.contributor.authorOzturk, O
dc.date.accessioned2023-04-18T02:48:18Z
dc.date.available2023-04-18T02:48:18Z
dc.date.issued2019.01.01
dc.identifier.doi10.1016/j.ceramint.2018.11.086
dc.identifier.eissn1873-3956
dc.identifier.endpage4183
dc.identifier.issn0272-8842
dc.identifier.issue4
dc.identifier.startpage4176
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000458228200004&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/10085
dc.identifier.volume45
dc.identifier.wosWOS:000458228200004
dc.relation.ispartofCERAMICS INTERNATIONAL
dc.titleComparison of theoretical and experimental microhardness of tetrahedral binary Zn1-xErxO semiconductor polycrystalline nanoparticles
dc.typeArticle
dspace.entity.typeWos
relation.isPublicationOfWos63a5d1fa-fcca-4584-b4de-c84f49d42eba
relation.isPublicationOfWos.latestForDiscovery63a5d1fa-fcca-4584-b4de-c84f49d42eba

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