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Dielectric properties, electric modulus and conductivity profiles of Al/Al2O3/p-Si type MOS capacitor in large frequency and bias interval

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dc.contributor.authorTan, SO
dc.contributor.authorCicek, O
dc.contributor.authorTurk, CG
dc.contributor.authorAltindal, S
dc.date.accessioned2023-04-19T00:53:33Z
dc.date.available2023-04-19T00:53:33Z
dc.date.issued2022.01.01
dc.identifier.doi10.1016/j.jestch.2021.05.021
dc.identifier.eissn
dc.identifier.endpage
dc.identifier.issn2215-0986
dc.identifier.issue
dc.identifier.startpage
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000821043900001&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/11221
dc.identifier.volume27
dc.identifier.wosWOS:000821043900001
dc.relation.ispartofENGINEERING SCIENCE AND TECHNOLOGY-AN INTERNATIONAL JOURNAL-JESTECH
dc.titleDielectric properties, electric modulus and conductivity profiles of Al/Al2O3/p-Si type MOS capacitor in large frequency and bias interval
dc.typeArticle
dspace.entity.typeWos
local.indexed.atWOS
relation.isPublicationOfWosd1095c4d-1ffc-4e82-8d5a-a35e8276b620
relation.isPublicationOfWos.latestForDiscoveryd1095c4d-1ffc-4e82-8d5a-a35e8276b620

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