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Analysis of indentation size effect (ISE) behavior in low-load Vickers microhardness testing of (Sm123)(1-x)(Nd123)(x) superconductor system

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dc.contributor.authorCelik, S
dc.contributor.authorOzturk, O
dc.contributor.authorCoskun, E
dc.contributor.authorSarihan, M
dc.contributor.authorAsikuzun, E
dc.contributor.authorOzturk, K
dc.contributor.authorTerzioglu, C
dc.date.accessioned2023-04-15T22:16:10Z
dc.date.available2023-04-15T22:16:10Z
dc.date.issued2013.01.01
dc.identifier.doi10.1007/s10854-013-1082-9
dc.identifier.eissn
dc.identifier.endpage2227
dc.identifier.issn0957-4522
dc.identifier.issue7
dc.identifier.startpage2218
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000321913000006&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/9094
dc.identifier.volume24
dc.identifier.wosWOS:000321913000006
dc.relation.ispartofJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
dc.titleAnalysis of indentation size effect (ISE) behavior in low-load Vickers microhardness testing of (Sm123)(1-x)(Nd123)(x) superconductor system
dc.typeArticle
dspace.entity.typeWos
relation.isPublicationOfWose4b49400-4f21-4416-802c-2a6cb8d8da39
relation.isPublicationOfWos.latestForDiscoverye4b49400-4f21-4416-802c-2a6cb8d8da39

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