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Temperature and tellurium (Te) dependence of electrical characterization and surface properties for a chalcopyrite structured schottky barrier diode

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dc.contributor.authorFiat, S
dc.contributor.authorBacaksiz, E
dc.contributor.authorKompitsas, M
dc.contributor.authorCankaya, G
dc.date.accessioned2023-04-15T22:17:41Z
dc.date.available2023-04-15T22:17:41Z
dc.date.issued2014.01.01
dc.identifier.doi10.1016/j.jallcom.2013.09.123
dc.identifier.eissn1873-4669
dc.identifier.endpage184
dc.identifier.issn0925-8388
dc.identifier.issue
dc.identifier.startpage178
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000327492600027&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/9128
dc.identifier.volume585
dc.identifier.wosWOS:000327492600027
dc.relation.ispartofJOURNAL OF ALLOYS AND COMPOUNDS
dc.titleTemperature and tellurium (Te) dependence of electrical characterization and surface properties for a chalcopyrite structured schottky barrier diode
dc.typeArticle
dspace.entity.typeWos
local.indexed.atWOS
relation.isPublicationOfWosdbd19ab3-a1c0-4ece-98e9-1e5c45cbc7b3
relation.isPublicationOfWos.latestForDiscoverydbd19ab3-a1c0-4ece-98e9-1e5c45cbc7b3

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