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An analysis of dielectric relaxation using the fractional master equation of the stochastic Ising model

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dc.contributor.authorCavus, MS
dc.date.accessioned2023-04-15T21:59:54Z
dc.date.available2023-04-15T21:59:54Z
dc.date.issued2011.01.01
dc.identifier.doi10.1016/j.jnoncrysol.2010.09.029
dc.identifier.eissn1873-4812
dc.identifier.endpage205
dc.identifier.issn0022-3093
dc.identifier.issue1
dc.identifier.startpage202
dc.identifier.urihttps://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000286173300036&DestLinkType=FullRecord&DestApp=WOS
dc.identifier.urihttps://hdl.handle.net/20.500.12597/8874
dc.identifier.volume357
dc.identifier.wosWOS:000286173300036
dc.relation.ispartofJOURNAL OF NON-CRYSTALLINE SOLIDS
dc.titleAn analysis of dielectric relaxation using the fractional master equation of the stochastic Ising model
dc.typeArticle
dspace.entity.typeWos
relation.isPublicationOfWosdf31525c-37a7-453b-b470-50ea29cc60f4
relation.isPublicationOfWos.latestForDiscoverydf31525c-37a7-453b-b470-50ea29cc60f4

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