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Identifying of series resistance and interface states on rhenium/n-GaAs structures using C-V-T and G/omega-V-T characteristics in frequency ranged 50 kHz to 5 MHz (November, 10.1007/S10854-019-02578-1, 2019)

dc.contributor.authorCicek, O
dc.contributor.authorDurmus, H
dc.contributor.authorAltindal, S
dc.date.accessioned2023-04-18T02:58:17Z
dc.date.available2023-04-18T02:58:17Z
dc.date.issued2020.01.01
dc.identifier.doi10.1007/s10854-019-02641-x
dc.identifier.eissn1573-482X
dc.identifier.endpage714
dc.identifier.issn0957-4522
dc.identifier.issue1
dc.identifier.startpage714
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dc.identifier.urihttps://hdl.handle.net/20.500.12597/10307
dc.identifier.volume31
dc.identifier.wosWOS:000499255200001
dc.relation.ispartofJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
dc.titleIdentifying of series resistance and interface states on rhenium/n-GaAs structures using C-V-T and G/omega-V-T characteristics in frequency ranged 50 kHz to 5 MHz (November, 10.1007/S10854-019-02578-1, 2019)
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