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Vertical CdTe:PVP/p-Si-Based Temperature Sensor by Using Aluminum Anode Schottky Contact

dc.contributor.authorCetinkaya, Hayriye Gokcen
dc.contributor.authorCicek, Osman
dc.contributor.authorAltindal, Semsettin
dc.contributor.authorBadali, Yosef
dc.contributor.authorDemirezen, Selcuk
dc.date.accessioned2026-01-04T17:29:35Z
dc.date.issued2022-12-01
dc.description.abstractIEEEThe vertical Schottky barrier diode (SBD)-based temperature sensors with the drive modes is a significant issue with more advantageous than the on-chip sensor. The sensitivity (<italic>S</italic>) and the current conduction mechanisms (CCMs) of the vertical CdTe:PVP/<italic>p</italic>-Si SBD were studied experimentally over the range of 80&#x2013;340 K and compared with that of the lateral and vertical sensors. It is shown that the low and moderated voltages of CdTe:PVP/<italic>p</italic>-Si corresponding two linear-regions of the current-voltage (I-V) outputs are around 0.1 - 0.3V and 0.4 - 0.65V, respectively. The variation of Schottky barrier height (&#x03A6;<sub><italic>Bo</italic></sub>) and ideality factor (<italic>n</italic>) with temperature was obtained according to two linear-regions. Energy dispersion of the interface-traps (<italic>N<sub>ss</sub></italic>) with changing temperature is additionally analyzed quantitatively. It is concluded that the thermionic-emission (TE) theory with Double-Gaussian distribution are the dominant mechanism resulting the I-V characteristics of the vertical CdTe:PVP/<italic>p</italic>-Si SBD in this study. Moreover, in constant current, the <italic>S</italic> values at the drive current of 10&#x03BC;A, 20&#x03BC;A and 50&#x03BC;A were resulting in a range of -1.6 to -1.8 mV/K.
dc.description.urihttps://doi.org/10.1109/jsen.2022.3212867
dc.description.urihttps://avesis.gazi.edu.tr/publication/details/f6af1a62-4902-448c-92cd-9a91b729f916/oai
dc.description.urihttp://hdl.handle.net/11467/6140
dc.identifier.doi10.1109/jsen.2022.3212867
dc.identifier.eissn2379-9153
dc.identifier.endpage22397
dc.identifier.issn1530-437X
dc.identifier.openairedoi_dedup___::eccbe79fda42ca250665b7b14399f3e4
dc.identifier.orcid0000-0002-4681-3037
dc.identifier.orcid0000-0002-2765-4165
dc.identifier.orcid0000-0001-7723-4188
dc.identifier.orcid0000-0001-7462-0251
dc.identifier.scopus2-s2.0-85140802551
dc.identifier.startpage22391
dc.identifier.urihttps://hdl.handle.net/20.500.12597/40160
dc.identifier.volume22
dc.identifier.wos000893571900010
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofIEEE Sensors Journal
dc.rightsEMBARGO
dc.subjectCurrent conduction mechanisms (CCMs), Schottky contact, temperature sensor, vertical diode
dc.subject.sdg7. Clean energy
dc.titleVertical CdTe:PVP/p-Si-Based Temperature Sensor by Using Aluminum Anode Schottky Contact
dc.typeArticle
dspace.entity.typePublication
local.import.sourceOpenAire
local.indexed.atWOS
local.indexed.atScopus

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