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Characteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method

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dc.contributor.authorÖztürk, Özgür
dc.contributor.authorAşikuzun, Elif
dc.contributor.authorHacioğlu, Zeynep Banu
dc.contributor.authorSafran, Serap
dc.date.accessioned2026-01-04T16:33:37Z
dc.date.issued2022-03-01
dc.description.abstractIn this study, Er doped ZnO based semiconducting nano thin films are produced by the sol-gel technique using dip coating method which is widely used method for preparing nano size materials. 〖Zn〗_(1-x) 〖Er〗_x O thin films are prepared different coating thickness using different solvent. The effect of the Er doping and film thickness on structural, electric and optic properties of the ZnO semiconducting nano thin films are investigated in detail and compared with undoped sample which prepared in same conditions. X-ray diffraction analysis (XRD) has been used to determine phase and lattice parameters of the semiconducting thin films and scanning electron microscope (SEM) measurements are made for microstructure properties. The resistivity measurement for electrical properties and transmittance measurement for optic properties have been carried out.
dc.description.urihttps://doi.org/10.2339/politeknik.676184
dc.description.urihttps://dergipark.org.tr/en/download/article-file/1267926
dc.description.urihttps://dx.doi.org/10.2339/politeknik.676184
dc.description.urihttps://dergipark.org.tr/tr/pub/politeknik/issue/68943/676184
dc.identifier.doi10.2339/politeknik.676184
dc.identifier.eissn2147-9429
dc.identifier.endpage45
dc.identifier.openairedoi_dedup___::a3bff952ee586200ed7c0f3c8ac4e207
dc.identifier.startpage37
dc.identifier.urihttps://hdl.handle.net/20.500.12597/39521
dc.identifier.volume25
dc.identifier.wos001001846700005
dc.publisherPoliteknik Dergisi
dc.relation.ispartofPoliteknik Dergisi
dc.rightsOPEN
dc.subjectZnO
dc.subjectthin film
dc.subjectsol-gel method
dc.subjectsemiconductor
dc.subjectEngineering
dc.subjectMühendislik
dc.subjectZnO
dc.subjectThin Film
dc.subjectSol-Gel Method
dc.subjectsemiconductor
dc.titleCharacteristics of ZnO:Er Nano Thin Films Produced Different Thickness Using Different Solvent By Sol-Gel Method
dc.typeArticle
dspace.entity.typePublication
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