Browsing by Author "Asikuzun, E, Ozturk, O, Arda, L, Terzioglu, C"

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Microstructural and electrical characterizations of transparent Er-doped ZnO nano thin films prepared by sol–gel process
(2017-10-01) Asikuzun E., Ozturk O., Arda L., Terzioglu C.; Asikuzun, E, Ozturk, O, Arda, L, Terzioglu, C
In this study, rare earth element (Er) doped ZnO nano thin films which have dual structure of (Zn1−xErx)O (x = 0.0, 0.01, 0.02, 0.03, 0.04 and 0.05) are prepared by using sol–gel method. The microstructure and electrical properties of prepared nano thin films are investigated. Nano thin films are coated on the glass substrate by using the dip coating method. The films are annealed at 600 °C for 30 min. The X-ray diffractometer (XRD), scanning electron microscopy and atomic force microscopy are used to determine the structural properties such as crystal structures, grain sizes, surface morphology; Hall effect measurements system is used to investigate the electrical properties of materials. XRD results showed that all Er doped nano thin films have a hexagonal structure and (002) orientation. Surface morphologies of ZnErO thin films are denser and more uniform than the undoped ZnO thin film. According to the Hall effect measurements, the resistivity of the films decreased with increasing Er concentration from 0 to 4 % and then slightly increased at 5 % Er.
Preparation, growth and characterization of nonvacuum Cu-doped ZnO thin films
(2018-08-05) Asikuzun E., Ozturk O., Arda L., Terzioglu C.; Asikuzun, E, Ozturk, O, Arda, L, Terzioglu, C
We investigated the effects of increasing Cu dopant concentration on the microstructure and optical properties of Zn1−xCuxO thin films. The transparent Zn1−xCuxO solution concentrations were varied from x = 0.0 to x = 0.05 with an increment of 0.01. All nano films were prepared by dip coating system using the sol-gel method. X-ray diffraction (XRD) measurements, scanning electron microscopy (SEM) observations, energy-dispersive X-ray spectroscopy (EDS) analyses, and atomic force microscopys (AFM) analyses revealed a fine-grained structure resulting from doping of Cu into the ZnO structure. In addition, UV–Vis spectrophotometer was used to determine the optic properties of ZnO based nano thin films. XRD analysis also showed that the undoped ZnO and Cu-doped ZnO films oriented along the (002) as the dominant plane. In the 400–700 nm wavelength range, a decrease in transparency was observed in the Zn1−xCuxO thin films with increasing Cu concentration. Although the optical band gap of the Cu-doped ZnO thin films was lower than that of the undoped ZnO thin film, the Urbach energy of the all of the doped thin films was higher than the undoped ZnO thin film.