Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffraction

Ozturk, MKHongbo, YSarikavak, BKorcak, SOzcelik, SOzbay, E2023-04-152023-04-152010.01.010957-4522https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000273753300014&DestLinkType=FullRecord&DestApp=WOShttps://hdl.handle.net/20.500.12597/8843Structural analysis of an InGaN/GaN based light emitting diode by X-ray diffractionArticle10.1007/s10854-009-9891-6WOS:000273753300014185191212