Analysis of indentation size effect (ISE) behavior in low-load Vickers microhardness testing of (Sm123)(1-x)(Nd123)(x) superconductor system

Celik, SOzturk, OCoskun, ESarihan, MAsikuzun, EOzturk, KTerzioglu, C2023-04-152023-04-152013.01.010957-4522https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000321913000006&DestLinkType=FullRecord&DestApp=WOShttps://hdl.handle.net/20.500.12597/9094Analysis of indentation size effect (ISE) behavior in low-load Vickers microhardness testing of (Sm123)(1-x)(Nd123)(x) superconductor systemArticle10.1007/s10854-013-1082-9WOS:00032191300000622182227247