Cicek, OKurnaz, SBekar, AOzturk, O2023-04-182023-04-182019.01.011359-8368https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=dspace_ku&SrcAuth=WosAPI&KeyUT=WOS:000485853800019&DestLinkType=FullRecord&DestApp=WOShttps://hdl.handle.net/20.500.12597/10245Comparative investigation on electronic properties of metal-semiconductor structures with variable ZnO thin film thickness for sensor applicationsArticle10.1016/j.compositesb.2019.106987WOS:0004858538000191741879-1069